Scan chains, ATPG, fault coverage, BIST, and boundary scan — the questions that test whether a chip can actually be tested after fabrication.
300+ carefully curated questions with detailed explanations, in one downloadable ebook.
DFT interviews focus on a different problem than functional design: not whether a chip works, but whether you can prove it works after it's been manufactured, at scale, cheaply.
This bank covers scan design, ATPG, fault modeling, and the built-in self-test and boundary scan concepts that show up in most DFT interviews.
Making internal flip-flops observable and controllable.
Automatically generating test patterns.
How DFT abstracts real manufacturing defects.
Letting the chip test itself.
Testing connectivity at the board level.
Measuring and scaling test quality.
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